PLEIADES

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ELECTRON DIFFRACTOMETER  PLEIADES  FOR   TEM     


HOW  MEASURE 
PRECISELY  ELECTRON  DIFFRACTION  INTENSITIES?

TEM  electron diffraction  intensities can be measured  by  films , image plates  and CCD cameras.  Intensity dynamic range for film is very low  ( 8 bit  or 256 grey levels ) although is bigger for  image plates (20 bit ) and CCD cameras ( from 12 bit  up  to 16 bit/64.000 grey levels ). ED patterns may have a huge dynamic range  (1 to 10 exp 6 ) and is not possible to measure accurately all ED  reflections with  previous detectors  at such dynamic range .

The  unique  (Patent protected ) single  nanocrystal  electron diffractometer  in combination with “spinning star” precession unit and  ( or stand-alone )  is able to scan  and measure  very  precisely  electron diffraction  reflections  with ultrahigh accuracy  at 24 bits dynamic range  (16.000.000 grey levels).

Electron diffraction intensities are  measured precisely by  scanning ED  pattern through specially designed   point detector ; every diffraction spot ( or pixel of ED spot ) can be measured  hundred of  times ( user defined ) for better statistical accuracy.

This ultrahigh  accuracy for measurement of diffraction  intensities is important to reveal 
precise  stoichiometry, light  atom detection , occupational parameters  and  reveal bonding effects and   electrostatic  potential  distribution  in  samples. Typical diffraction patterns  (500 reflections) can be measured from few seconds to minutes in combination  with  precession  and integral intensities can be accurately  measured  after  background  correction.

Electron diffractometer « Pleiades » can be interfaced with any TEM at the 35 mm port  by 
means of  specially designed mechanical  inteface (Fischione  Inc )and compatible with  HAADF detector or CCD  at the same port.

 
Download   HERE  short  PDF  presentation  about  electron diffractometer  PLEIADES

ELECTRON DIFFRACTOMETER 
PLEIADES  FOR   TEM 
 
 
easily retrofitable to any (old or new) TEM 100- 300 kV in the 35 mm port
  can collect automatically ED intensities  from any zone axis in  SAED / precession mode
  measure ED  intensities with ultrahigh dynamic range 24 bits (16.000.000 grey levels)
  all  ED reflections  are  measured  accurately ( including  central  beam ) without  saturation
  work as stand alone or with interface  precession  unit
« spinning star »
  dedicated  interface to 35mm port (Fischione) compatible with  HAADF detector

  output data compatible with X-ray crystallography software to solve crystal  nanostructures
  advanced  software  to reveal  light atoms, stoichiometry , occupancy factors electrostatic potential  
 

PLEIADES  TO  ENHANCE   NEW  TEMs   

Tecnai 10 (100 kv ) , Jeol  2100 ( 200 kv )  - from left  to right -  interfaced  with precession  unit  spinning star  and  electron diffractomter Pleiades for  advanced nanostructure analysis

PLEIADES  TO  UPGRADE   OLDER  TEMs 
 


EM 400 Philips (120 kv ), CM 12 Philips (120 kv ) and Philips CM 10 ( 100 KV ) -from left  to right – interfaced with precession unit  spinning star and electron diffractometer for  advanced Nanostructure  analysis.
 


 

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